 |
Archived Publications - 2005
Journal and Other External Publications
K. Balakrishnan, NEC Laboratories America, "Emerging Techniques for Test Data Compression", Proceedings of the Asian Test Symposium pp. 462-462, 2005
K. J. Balakrishnan, NEC Laboratories America, N. A. Touba, University of Texas at Austin and S. Patil, Intel Corporation, "Compressing Functional Tests for Microprocessors", Proceedings of the Asian Test Symposium - ATS 05 pp. 428-433, 2005
E.A. Yuzbashyan, Rutgers University, B.L. Altshuler, NEC Laboratories America \& Princeton University, V. B. Kuznetsov, University of Leeds and V. Z. Enolskii, Heriot-Watt University, "Nonequilibrium cooper pairing in the nonadiabatic regime", Physical Review B 72(22):220503(1-4), 2005
F. Regazzoni, ALaRI-USI and M. Lajolo, NEC Laboratories America, "Hardware/Software Partitioning and Interface Synthesis in Networks On Chip", Proceedings of the IP Based SoC Design Conference and Exhibition IP-SOC 2005 pp. 291-296, 2005
M.L. Miller, NEC Laboratories America, "Greedy Quantization: A flexible approach to adaptive compression", Proceedings of the Fifth International Conference on Information, Communications and Signal Processing np, 2005
C. Wang, NEC Laboratories America, F. Ivancic, NEC Laboratories America, M.K. Ganai, NEC Laboratories America and A. Gupta, NEC Laboratories America, "Deciding Separation Logic Formulae with SAT by Incremental Negative Cycle Elimination", Proceedings of the 12th. International Conference on Logic for Programming, Artificial Intelligence and Reasoning - LPAR 2005 - Lecture Notes in Computer Science - LNCS 3835 - Lecture Notes in Artificial Intelligence 3835 Sutcliffe, Geoff (ed.), Springer-Verlag, New York, pp. 322-336, 2005
L. Xu, NEC Laboratories America, Ting Wang, NEC Laboratories America,
O. Matsuda, NEC Corporation, I. Glesk, Princeton University and P. Prucnal,
Princeton University, "Wavelength Shift Keying (WDK) Encoded Pulses
for Optical Labelling Applications", IEEE Photonics Technology
Letters 17(12):2775-2777, 2005
R.G. Endres, Oak Ridge National Laboratory, T.C. Schulthess, Oak Ridge National Laboratory and N.S. Wingreen, NEC Laboratories America, "Preferred Binding Sites of Gene Regulatory Proteins Based on the Deterministic Dead-End Elimination Algorithm", Springer Proceedings in Physics, Volume 103, Computer Simulation Studies in Condensed Matter Physics XVII Landau, D.P. (ed.), Springer Verlag, Berlin, pp. 100-108, 2005
P. Appan, Arizona State University, B.L. Tseng, NEC Laboratories SV and H. Sundaram, Arizona State University, "Weblog entry categorization based on query context", Arizona State University Technical Report np, 2005
D. Cavendish, NEC Laboratories America SV, P.N. Ji, NEC Laboratories America, D. Qian, NEC Laboratories America, Ting Wang, NEC Laboratories America and L. Zong, NEC Laboratories America, "Next Generation Multi-Service Optical Networks", Proceedings of the Asia-Pacific Optical Communications Conference APOC 2005 - Proceedings of SPIE 6022 60220R(1-10), 2005
L. Zong, NEC Laboratories America, P. Ji, NEC Laboratories America, L. Xu, NEC Laboratories America, Ting Wang, NEC Laboratories America, O. Matsuda, NEC Corporation and M. Cvijetic, NEC America, "A ROADM-based testbed for multiservice metro WDM networks", Proceedings of the Asia-Pacific Optical Communications Conference APOC 2005 - Proceedings of SPIE 6022 602211(1-7), 2005
V. Gasparian, California State University, B.L. Altshuler, NEC Laboratories America and M. Ortuno, University of Murcia, "Charge Pumping in One-dimensional Kronig-Penney Models", Physical Review B 72(19):195309(1-6), 2005
Y. Wu, University of California - Santa Barbara, E. Chang, University of California - Santa Barbara and B.L. Tseng, NEC Laboratories America SV, "Multimodal Metadata Fusion Using Causal Strength", Proceedings of the 13th. annual ACM International Conference on Multimedia MM 2005 np, 2005
Mango Chia Tso Chao, University of California, S. Wang, NEC Laboratories America, S.T. Chakradhar, NEC Laboratories America and K.T. Cheng, University of California, "Response Shaper: A Novel Technique to Enhance Unknown Tolerance for Output Response Compaction", Proceedings of the IEEE/ACM International Conference on Computer-Aided Design pp. 80-87, 2005
S. Wang, NEC Laboratories America, K. Balakrishnan, NEC Laboratories America and S. T. Chakradhar, NEC Laboratories America, "XWRC: Externally-loaded Weighted Random Pattern Testing for Input Test Data Compression", Proceedings of the International Test Conference - ITC pp. 571-580, 2005
W. Wang, Princeton University, A. Raghunathan, CCRL, G. Lakshminarayana, CCRL and N.K. Jha, Princeton University, "Input Space-Adaptive Optimization for Embedded-Software Synthesis", IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems 24(11):1677-1693, 2005
G. Yue, NEC Laboratories America and X. Wang, NEC Laboratories America, "Optimization of Irregular Repeat Accumulate Codes for MIMO System with Iterative Receivers", IEEE Transactions on Wireless Communications 4(6):2843-2855, 2005
C. Huang, Princeton University, S. Ravi, NEC Laboratories America, A. Raghunathan, NEC Laboratories America and N.K. Jha, Princeton University, "Generation of Distributed Logic-memory Architectures through High-Level Synthesis", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24(11):1694-1711, 2005
J. Wang, NEC Laboratories America, X. Wang, NEC Laboratories America and M. Madihian, NEC Laboratories America, "On the Optimum Design of Space-Time Linear Dispersion Codes", IEEE Transactions on Wireless Communications 4(5):2928-2938, 2005
F. Hao, Bell Labs, M. S. Kodialam, Bell Labs, T. V. Lakshman, Bell Labs and Hui Zhang, NEC Laboratories America, "Fast Payload-Based Flow Estimation for Traffic Monitoring and Network Security", Proceedings of the 2005 Symposium on Architecture for networking and Communications Systems ANCS '05 pp. 211- 220, 2005
E.A. Yuzbashyan, NEC Laboratories America, V.B. Kuznetsov, NEC Laboratories America and B.L. Altshuler, NEC Laboratories America \& Princeton University, "Integrable Dynamics of Coupled Fermi-Bose Condensates", Physical Review B 72(14):144524(1-9), 2005
A. Bordes, NEC Laboratories America \& ESPCI and L. Bottou, NEC Laboratories America, "The Huller: A Simple and Efficient Online SVM", Machine Learning : ECML 2005, Proceedings of the 16th. European Conference On Machine Learning, Lecture Notes in Computer Science, LNCS 3720, Lecture Notes in Artificial Intelligence LNAI 3720 Gama, J.(ed.), Springer Verlag, Berlin, pp. 505-512, 2005
Mango Chia Tso Chao, NEC Laboratories America, S. Wang, NEC Laboratories America, S.T. Chakradhar, NEC Laboratories America and K.T. Cheng, University of California, "ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values", Proceedings of IEEE Conference on Computer Design ICCD pp.147-152, 2005
F. Ivancic, NEC Laboratories America, I. Shlyakhter, NEC Laboratories America, A. Gupta, NEC Laboratories America, M.K. Ganai, NEC Laboratories America, V. Kahlon, NEC Laboratories America, C. Wang, NEC Laboratories America and Z. Yang, Western Michigan University, "Model Checking C Programs Using F-Soft", Proceedings of the International Conference on Computer Design - ICCD 2005 pp. 297-308, 2005
F. Regazzoni, ALaRI-USI, A.C. Nacul, University of California and M. Lajolo, NEC Laboratories America, "Automatic synthesis of the Hardware/Software Interface in Multiprocessor Architectures", Proceedings of the Forum on specification and Design Languages - FDL'05 pp. 401-404, 2005
C. Park, University of California, K. Lahiri, NEC Laboratories America and A. Raghunathan, NEC Laboratories America, "Battery Discharge Characteristics of Wireless Sensor Nodes: An Experimental Analysis", Proceedings of IEEE Conference on Sensor and Ad Hoc Communications and Networks pp. 430-440, 2005
J. Coburn, NEC Laboratories America, S. Ravi, NEC Laboratories America, A. Raghunathan, NEC Laboratories America and S.T. Chakradhar, NEC Laboratories America, "SECA : Security-enhanced Communication Architecture", Proceedings of the ACM/IEEE Conference on Compilers, Architecture, and Synthesis for Embedded Systems - CASES pp. 78-89, 2005
E. Kruus, NEC Laboratories America, P. Thumfort, NEC Laboratories America, Chao Tang, NEC Laboratories America and N.S. Wingreen, NEC Laboratories America, "Gibbs Sampling and Helix-cap Motifs", Nucleic Acids Research 33(16):5343:5353, 2005
D. Arora, Princeton University, S. Ravi, NEC Laboratories America, A. Raghunathan, NEC Laboratories America and N.K. Jha, Princeton University, "Enhancing Security through Hardware-assisted Run-time Validation of Program Data Properties", Proceedings of ACM/IEEE International Conference on Hardware/Software Codesign and System Synthesis pp. 190-195, 2005
L. Yang, Northwestern University, H. Lekatsas, NEC Laboratories America, R. P. Dick, Northwestern University and S. T. Chakradhar, NEC Laboratories America, "CRAMES : Compressed RAM for Embedded Systems", Proceedings of the IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis CODES + ISSS '05 pp. 93-98, 2005
C. Huang, Princeton University, S. Ravi, NEC Laboratories America, A. Raghunathan, NEC Laboratories America and N.K. Jha, Princeton University, "Eliminating Memory Bottlenecks for a JPEG Encoder Through Distributed Logic-Memory Architecture and Computation-unit Integrated Memory", Proceedings of the 2005 IEEE Custom Integrated Circuits Conference pp. 236-239, 2005
Lin Lin, University College London, G.J. Doerr, Eurecom Institute, I.J. Cox, University College London and M.L. Miller, NEC Laboratories America, "An Efficient Algorithm for Informed Embedding of dirty-paper Trellis Coses for Watermarking", Proceedings of IEEE International Conference on Image Processing ICIP 2005 1:697-700, 2005
E.A. Yuzbashyan, Rutgers University, B.L. Altshuler, NEC Laboratories America \& Princeton University, V. B. Kuznetsov, University of Leeds and V. Z. Enolskii, Heriot-Watt University, "Solution for the dynamics of the BCS and central spin problems", Journal of Physics A ; Mathematical and General 38(36):7831-7849, 2005
M. Silva, University of Waterloo, M. Roetteler, NEC Laboratories America and C. Zalka, University of Waterloo, "Thresholds for Linear Optics Quantum Computing with Photon Loss at the Detectors", Physical Review A 72(3):032307(1-8), 2005
G. Yue, NEC Laboratories America, L. Ping, city University of Hong Kong and X. Wang, Columbia University, "Low Rate Generalized Low Density Parity check Codes with Hadamard Constraints", Proceedings of 2005 IEEE International symposium on Information Theory - ISIT 2005 pp. 1377-1381, 2005
M. Grassl, Karlsruhe University and M. Roetteler, NEC Laboratories America, "Quantum Block and Convolution Codes from Self-orthogonal Product Codes", Proceedings of the 2005 IEEE International Symposium on Information Theory - ISIT pp, 1018-1022, 2005
A. Klappenecker, Texas A&M University and M. Roetteler, NEC laboratories America, "Mutually Unbiased Bases are Complex Projective 2-Designs", Proceedings of 2005 IEEE International Symposium on Information Theory - ISIT pp. 1740-1744, 2005
F. Ning, Courant Institute of Mathematical Sciences, D. Delhomme, Ecole Centrale de Paris, Y. LeCun, Courant Institute of Mathematical Sciences, F. Piano, New York University, L. Bottou, NEC Laboratories America and P. E. Barbano, Yale University, "Toward Automatic Phenotyping of Developing Embryos from Videos", IEEE Transactions in Image Processing 14(9):1360-1371, 2005
J. Wang, NEC Laboratories America, X. Wang, NEC Laboratories America and M. Madihian, NEC Laboratories America, "Design of Minimum Error-Rate Cayley Differential Unitary Space-Time Codes", IEEE Journal on Selected Areas in Communications 23(9):1779-1787, 2005
K. Hirose, NEC Japan and N.S. Wingreen, NEC laboratories America, "Electronic States and Spin in Clean and Disordered Quantum Dots : - Spin-Density_Functional Study", Horizons in World Physics - Volume 251 - Quantum Dots Research Developments Ling, Peter A. (ed.), Nova Science, New York, pp. 1-45, 2005
A. Bordes, NEC Laboratories America \& ESPCI, S. Ertekin, Pennsylvania State University, J. Weston, NEC Laboratories America and L. Bottou, NEC Laboratories America, "Fast Kernel Classifiers with Online and Active Learning", Journal of Machine Learning Research 6:1579-1619, 2005
L. Chen, NEC Laboratories America SV, K. S. Candan, NEC Laboratories America SV, J. Tatemura, NEC Laboratories America SV, D. Agrawal, NEC Laboratories America SV and D. Cavendish, NEC Laboratories America SV, "On Overlay Schemes to Support Point-in-Range Queries for Scalable Grid Resource Discovery", Proceedings of the Fifth IEEE International Conference on Peer-to-Peer Computing P2P'05 pp. 23-30, 2005
W. S. Noble, University of Washington, R. Kuang, Columbia University, C. Leslie, Columbia University and J. Weston, NEC Laboratories America, "Identifying remote protein homologs by network propagation", The FEBS Journal 272(20):5119-5128, 2005
X. Song, University of Washington, C.Y. Lin, University of Washington, M.T. Sun, University of Washington and B.L. Tseng, NEC Laboratories America SV, "Modeling and Predicting Personal Information Dissemination Behavior", Proceedings of the 11th. ACM SIGKDD International Conference on Knowledge Discovery in Data Mining pp. 479-488, 2005
H. Chen, NEC Laboratories America, G. Jiang, NEC Laboratories America, C. Ungureanu, NEC Laboratories America and K. Yoshihira, NEC Laboratories America, "Failure Detection and Localization in Component Based Systems by Online Tracking", Proceedings of the 11th. ACM SIGKDD International Conference on Knowledge Discovery in Data Mining pp. 750-755, 2005
S. Hallgren, NEC Laboratories America, A. Russell, University of Connecticut and I. Shparlinski, Macquarie University, "Quantum Noisy Rational Function Reconstruction", 11th. Annual International Conference on Computing and Combinatorics - COCOON 2005, Lecture Notes in Computer Science LNCS 3595 Wang, Lusheng (ed.), Springer Verlag, Berlin, pp. 420-429, 2005
S. Zhu, NEC Laboratories America SV, X. Ji, NEC Laboratories America SV, W. Xu, NEC Laboratories America SV and Y. Gong, NEC Laboratories America SV, "Multi-labeled Classification Using Maximum Entropy Method", Proceedings of the Conference on Research and Development in Information Retrieval - SIGIR '05 pp. 274-281, 2005
V.I. Falko, Lancaster University, B.L. Altshuler, Princeton University and O. Tsyplyatyev, Lancaster University, "Anisotropy of Spin Splitting and Spin Relaxation in Lateral Quantum Dots", Physical Review Letters 95(7):076603(1-4), 2005
C. Cortes, Google Research, M. Mohri, New York University and J. Weston, NEC Laboratories America, "A General Regression Technique for Learning Transductions", Proceedings of the Twenty-second International Conference on Machine Learning pp. 153-160, 2005
E. Ie, Columbia University, J. Weston, NEC Laboratories America, W.S. Noble, University of Washington and C. Leslie, Columbia University, "Multi-Class Protein Fold Detection Using Adaptive Codes", Proceedings of the Twenty-second International Conference on Machine Learning pp. 329-336, 2005
R. Kuang, Columbia University, J. Weston, NEC Laboratories America, W. S. Noble, University of Washington and C. Leslie, Columbia University, "Motif-based Protein Ranking by Network Propagation", Bioinformatics 21(19):3711-3718, 2005
A. Klappenecker, Texas A&M University and M. Roetteler, NEC Laboratories America, "Mutually unbiased bases, spherical designs, and frames", Proceedings of the SPIE 5914, Papadakis, Manos (ed.) 59140P(1-13), 2005
L. Chen, NEC Laboratories America SV, K. S. Candan, NEC Laboratories America SV, J. Tatemura, NEC Laboratories America SV, D. Agrawal, NEC Laboratories America SV and D. Cavendish, NEC Laboratories America SV, "DHT Overlay Schemes for Scalable p-Range Resource Discovery", Proceedings of 14th. IEEE International Symposium on High Performance Distributed Computing, 2005 HPDC-14 pp. 297-298, 2005
X. Song, University of Washington, B.L. Tseng, NEC Laboratories America SV, C.Y. Lin, University of Washington and M.T. Sun, University of Washington, "ExpertiseNET : Relational and Evolutionary Expert Modeling", 10th. International Conference on User modeling UM 2005 - Lecture Notes in Computer Science 3538 - LNCS 3538 Ardissono, Liliana (ed.), Springer-Verlag, Berlin, pp. 99-108, 2005
L. Faoro, Rutgers University, J. Bergli, Princeton University, B. L. Altshuler, NEC Laboratories America, Y. M. Galperin, University of Oslo and A.F. Ioffe, Russian Academy of Sciences, "Models of Environment and $T_1$ Relaxation in Josephson Charge Qubits", Physical Review Letters 95(4):046805(1-4), 2005
J. Radhakrishnan, Tata Institute of Fundamental Research, M. Roetteler, NEC Laboratories America and P. Sen, NEC Laboratories America, "On the Power of Random Bases in Fourier Sampling: Hidden Subgroup Problem in the Heisenberg Group", Proceedings of the International Colloquium on Automata, Languages and Programming - ICALP 2005;Lecture Notes in Computer Science 3580 - LNCS 3580 Caires, L. (ed.), Springer Verlag, Berlin, pp. 1399-1411, 2005
F. Ivancic, NEC Laboratories America, "Model-Based Development for Hybrid Systems", Proceedings of the 9th. World multi-Conference on Systemics, Cybernetics and Informatics pp. 53-58, 2006
V. Kahlon, NEC Laboratories America, F. Ivancic, NEC laboratories America and A. Gupta, NEC Laboratories America, "Reasoning about Threads Communicating via Locks", Proceedings of the 17th. International Conference on Computer Aided Verification - CAV 2005, Lecture Notes in Computer Science LNCS 3576 Etessami, K. (ed.), Springer Verlag, Berlin, pp. 505-518, 2005
F. Ivancic, NEC Laboratories America, Z. Yang, Western Michigan University, M.K. Ganai, NEC Laboratories America, A. Gupta, NEC Laboratories America, I. Shlyakhter, NEC Laboratories America and P. Ashar, Real Intent, "F-Soft: Software Verification Platform", Computer Aided Verification : 17th. International Conference on Computer Aided Verification 2005 - CAV 2005, Lecture Notes in Computer Science LNCS 3576 Etessami, K. (ed.), Springer Verlag, Berlin, pp. 301-306, 2005
J. Li, Princeton University, J. Chun, Princeton University, N.S. Wingreen, NEC Laboratories America, R. Car, Princeton University, I. Aksay, Princeton University and D. Saville, Princeton University, "The Use of Dielectric Functions in the Modern Theory of Dispersion Forces", Virtual Journal of Nanoscale Science and Technology 12(1):np, 2005
K.S. Candan, NEC Laboratories America SV, Y. Akca, NEC Laboratories America SV and W.S. Li, NEC Laboratories America SV, "Policy-Based Resource Sharing in Streaming Overlay Networks", Web Content Delivery Tang, Xueyan, Springer, New York, pp. 215-244, 2005
Y.M. Galperin, University of Oslo, D.V. Shantsev, University of Oslo, J. Bergli, Princeton University and B.L. Altshuler, NEC Laboratories America, "Rabi Oscillations of a Qubit Coupled to a Two-level System", Europhysics Letters 71(1):21-27, 2005
J. Fan, NEC Laboratories America, A. Dogariu, NEC Laboratories America and L.J. Wang, Max-Planck Research, "Generation of Correlated Photon Pairs in a Micro-Structured Fiber", Optics Letters 30(12):1530-1532, 2005
J. Li, Princeton University, J. Chun, Princeton University, N.S. Wingreen, NEC Laboratories America, R. Car, Princeton University, I. Aksay, Princeton University and D. Saville, Princeton University, "The Use of Dielectric Functions in the Modern Theory of Dispersion Forces", Physical Review B 71(23):235412(1-6), 2005
G. H. Bakir, Max Planck Institute, L. Bottou, NEC Laboratories America and J. Weston, NEC Laboratories America, "Breaking SVM Complexity with Cross-Training", Advances in Neural Information Processing Systems 17 Saul, L.K. (ed.), MIT Press, Cambridge, pp. 81-88, 2005
H.P. Graf, NEC Laboratories America, E. Cosatto, NEC Laboratories America, L. Bottou, NEC Laboratories America, I. Durdanovic, NEC Laboratories America and V.N. Vapnik, , "Parallel Support Vector machines: The Cascade SVM", Advances in Neural Information Processing Systems 17 Saul, L.K. (ed.), MIT Press, Cambridge, pp. 521-528, 2005
S. Sengupta, University of Central Florida, M. Chatterjee, University of Central Florida, S. Ganguly, NEC Laboratories America and R.Izmailov, NEC Laboratories America, "Exploiting MAC Flexibility in WiMAX for Media Streaming", Proceedings of the sixth IEEE International symposium on World of Wireless Mobile and Multimedia Networks, 2005 pp. 338-343, 2005
G. Jiang, NEC Laboratories America, H. Chen, NEC Laboratories America, C. Ungureanu, NEC Laboratories America and K. Yoshihira, NEC Laboratories America, "Multi-resolution Abnormal Trace Detection Using Varied-length N-grams and Automata", Proceedings of the 2nd. IEEE International Conference on Autonomic Computing (ICAC-05) pp. 111-122, 2005
M. Osadchy, NEC Laboratories America, M.L. Miller, NEC Laboratories America and Y. LeCun, New York University, "Synergistic Face Detection and Pose Estimation with Energy-Based Models", Advances in Neural Information Processing systems 17 Saul, L.K.(ed.), MIT Press, Cambridge, pp. 1017-1024, 2005
M.K. Ganai, NEC Laboratories America, A. Gupta, NEC Laboratories America and P. Ashar, NEC laboratories America, "Beyond Safety ; Customized SAT-Based model Checking", Proceedings of the ACM/IEEE 42nd. Design Automation Conference - DAC 2005 pp. 738-743, 2005
J. Coburn, NEC Laboratories America, S. Ravi, NEC Laboratories America and A. Raghunathan, NEC Laboratories America, "Power Emulation: A New Paradigm for Power Estimation", Proceedings of the 42nd. Annual ACM/IEEE Conference on Design Automation 2005 DAC'05 pp. 700-705, 2005
A. Muttreja, Princeton University, A. Raghunathan, NEC Laboratories America, S. Ravi, NEC Laboratories America and N.K. Jha, Princeton University, "Hybrid Simulation for Embedded Software Energy Estimation", Proceedings of the 42nd. Annual ACM/IEEE Conference on Design Automation 2005 DAC'05 pp. 23-26, 2005
P. Gupta, Princeton University, S. Ravi, NEC Laboratories America, A. Raghunathan, NEC Laboratories America and N.K. Jha, Princeton University, "Efficient Fingerprint-based User Authentication for Embedded Systems", Proceedings of the 42nd. Annual ACM/IEEE Conference on Design Automation 2005 DAC'05 pp. 244-247, 2005
K. Sekar, University of California, K. Lahiri, NEC Laboratories America, A. Raghunathan, NEC Laboratories America and S. Day, University of California, "FLEXBUS: A High-Performance System-on-Chip Communication Architecture with a Dynamically Configurable Topology", Proceedings of the 42nd. Annual ACM/IEEE Conference on Design Automation 2005 DAC'05 pp. 571-574, 2005
A. S. Basu, NEC Laboratories America, M. Lajolo, NEC Laboratories America and M. Prevostini, ALaRI, "Design and Synthesis of Reusable Platforms with Programmable Interconnects", Proceedings of the DAC 2005 Workshop, UML-SoC 2005, UML for SoC Design pp. 43-48, 2005
J. Koenemann, University of Hannover, R.J. Haug, University of Hannover, D.K. Maude, CNRS, V.I. Falko, Lancaster University and B.L. Altshuler, NEC Laboratories America, "Spin-Orbit Coupling and Anisotropy of Spin Splitting in Quantum Dots", Physical Review Letters 94(22):226404(1-4), 2005
J. Weston, NEC Laboratories America, B. Scheolkopf, Max Planck Institute and O. Bousquet, Max Planck Institute, "Joint Kernel Maps", Proceedings of the 8th. International Work Conference on Artificial Neural Networks, IWANN 2005, Computational Intelligence and Bioinspired Systems, Lecture Notes in Computer Science 3512 Cabestany, J. (ed), Springer Verlag, Berlin pp. 176-191, 2005
A. Klappenecker, Texas A&M University and M. Roetteler, NEC Laboratories America, "Solution to the Mean King Problem in Prime Power Dimensions and Discrete Tomography", Electronic Notes in Discrete Mathematics, Proceedings of the 2005 Workshop on Discrete Tomography 20:165-177, 2005
H. Lekatsas, CCRL, J. Henkel, CCRL and W. Wolf, Princeton University, "Approximate Arithmetic Coding for Bus Transition Reduction in Low Power Designs", IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13(6):696-707, 2005
H. Wei, NEC Laboratories America, S. Ganguly, NEC Laboratories America, R. Izmailov, NEC Laboratories America and Z.J. Haas, Cornell University, "Interference-Aware IEEE 802.16 WiMax Mesh Networks", Proceedings of the 61st IEEE Vehicular Technology Conference 5:3102-3106, 2005
J. Fan, NEC Laboratories America, A. Dogariu, NEC Laboratories America and L.J. Wang, Max-Planck Research, "Generation of Correlated Photons with Conjugate Pumps in a Microstructure Fiber", Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science CLEO/QELS 2005 1:164-166, 2005
J. Xu, Princeton University, W. Wolf, Princeton University, J. Henkel, NEC Laboratories America, S. Chakradhar, NEC Laboratories America and T. Lv, Princeton University, "A Methodology for Design, Modeling, and Analysis of Networks-on-Chip", Proceedings of IEEE International Symposium on Circuits and Systems ISCAS 2:1778-81, 2005
S. Hallgren, NEC Laboratories America, "Fast Quantum Algorithms for Computing the Unit Group and Class Group of a Number Field", Proceedings of the 37th. ACM Symposium on Theory of Computing - STOC 2005 pp. 468-474, 2005
A. Kolarov, NEC Laboratories America and B. Sengupta, ExxonMobil, "A Study of Waveband Routing and Wavelength Assignment in Multi-Granular Hybrid Optical Networks", Proceedings of the 2005 IEEE International Conference on Communications ICC 1:239-243, 2005
A. Sen, Arizona State University, B. Hao, Arizona State University, B.H. Shen, Arizona State University, L. Zhou, Arizona State University and S. Ganguly, NEC Laboratories America, "On Maximum Available Bandwidth through Disjoint Paths", 2005 Workshop on IEEE High Performance Switching and Routing pp. 34-38, 2005
J. Weston, NEC Laboratories America, C. Leslie, Columbia University, E. Le, Columbia University, D. Zhou, Max-Planck Institute for Biological Cybernetics, A. Elisseeff, Max-Planck Institute for Biological Cybernetics and W.S. Noble, University of Washington, "Semi-Supervised Protein Classification using cluster kernels", Bioinformatics 21(15):3241-3247, 2005
B.L. Tseng, NEC Laboratories America SV, J. Tatemura, NEC Laboratories America and Y. Wu, University of California, "Tomographic Clustering To Visualize Blog Communities as Mountain Views", Proceedings of the WWW 2005 2nd. Annual Workshop on the Weblogging Ecosystem: Aggregation, Analysis and Dynamics np, 2005
A. Huebsch, University of California and R.G. Endres, NEC Laboratories America, "Optical Conductivity of Wet DNA", Physical Review Letters 94(17):178102(1-4), 2005
D.S. Saraga, University of Basel, B.L. Altshuler, NEC Laboratories America \& Princeton University, D. Loss, University of Basel and R.M. Westervelt, Harvard University, "Coulomb Scattering Cross Section in a Two-Dimensional Electron Gas and Production of Entangled Electrons", Physical Review B 71(4):045338(1-18), 2005
A. Mitra, NEC Laboratories America /& University of California, M. Lajolo, NEC Laboratories America and K. Lahiri, NEC Laboratories America, "SOFTENIT: A Methodology for Boosting the Software Content of System-on-Chip Designs", Proceedings of the 15th. ACM Great Lakes Symposium on VLSI pp. 361-366, 2005
B. Lu, NEC Laboratories America, G. Yue, NEC Laboratories America, X. Wang, NEC Laboratories America and M. Madihian, NEC Laboratories America, "Factor Graph Based Soft Self-Iterative Equalizer for Multipath Channels", EURASIP Journal on Wireless Communications and Networking 2005(2):187-196, 2005
L. Bottou, NEC Laboratories America and Y. LeCun, New York University, "Graph Transformer Networks for Image Recognition", Proceedings of the 55th. Session of the International Statistical Institute - ISI np., 2005
C.H. Park, Pusan National University and D.J. Chadi, NEC Laboratories America, "Hydrogen-mediated Spin-Spin Interaction in ZnCoO", Physical Review Letters 94(12):127204(1-4), 2005
M. Kloster, Princeton University, Chao Tang, NEC Laboratories America and N.S. Wingreen, NEC Laboratories America, "Finding Regulatory Modules Through Large Scale Gene Expression Data Analysis", Bioinformatics 21(7):1172-1179, 2005
S. Parameswaran, University of Queensland and J. Henkel, NEC Laboratories America, "Instruction Code Mapping for Performance Increase and Energy Reduction in Embedded Computer systems", IEEE Transactions on Very Large Scale Integration - VLSI 13(4):498-502, 2005
V.N. Vapnik, NEC Laboratories America, "Universal Learning Technology: Support Vector Machines", NEC Journal of Advanced Technology 2(2):137-144, 2004
L. Bottou, NEC Laboratories America and Y. LeCun, NEC Laboratories America, "On-line Learning for Very Large Datasets", Applied Stochastic Models in Business and Industry 21:137-151, 2005
M. Pueschel, Carnegie Mellon University and M. Roetteler, NEC Laboratories America, "Fourier Transform for the Directed Quincunx Lattice", 2005 IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP) 4:401-404, 2005
P. Lucignano, University of Naples, B. Jouault, University of Montpellier, A. Tagliacozzo, University of Naples and B.L. Altshuler, NEC Laboratories America, "Rashba Control for the Spin Excitation of a Fully Spin-polarized Vertical Quantum Dot", Physical Review B 71(12):121310(1-4), 2005
S. Ganguly, NEC Laboratories America, A. Saxena, NEC Laboratories America, S. Bhatnagar, NEC Laboratories America, R. Izmailov, NEC Laboratories America and S. Banerjee, University of Wisconsin, "Fast Replication in Content Distribution Overlays", IEEE INFOCOM 2005 4:2246-2256, 2005
S. Sengupta, University of Central Florida, M. Chatterjee, University of Central Florida, S. Ganguly, NEC Laboratories America and R. Izmailov, NEC Laboratories America, "WRN ; Improving system performance in 3G networks through fixed multi-hop relay nodes", Proceedings of the 2005 IEEE Wireless Communications and Networking Conference 3:1708-1713, 2005
L. Zong, NEC Laboratories America, P. Ji, NEC Laboratories America, Ting Wang, NEC Laboratories America, H. Liu, NEC Laboratories America and O. Matsuda, NEC Corporation, "Reconfigurable Optical Add/Drop Multiplexer Realized with Novel Tunable Devices", Proceedings of the National Fiber Optic Engineers Conference pp. 1-4, 2005
D. Arora, Princeton University, S. Ravi, NEC Laboratories America, A. Raghunathan, NEC Laboratories America and N. K. Jha, Princeton University, "Secure Embedded Processing through Hardware-assisted Runtime Monitoring", Proceedings of the Conference on Design, Automation and Test in Europe 1:178-183, 2005
J. Coburn, NEC Laboratories America, S. Ravi, NEC Laboratories America and A. Raghunathan, NEC Laboratories America, "Hardware Accelerated Power Estimation", Proceedings of the Design, Automation and Test in Europe Conference and Exhibition - DATE'05 1:528-529, 2005
M.K. Ganai, NEC Laboratories America, A. Gupta, NEC Laboratories America and P. Ashar, NEC Laboratories America, "Verification of Embedded Memory Systems using Efficient Memory Modeling", Proceedings of the Design Automation and Test in Europe Conference 2005 DATE pp. 1096-1101, 2005
L. Fortnow, University of Chicago, J. Kilian, NEC Laboratories America, D.M. Pennock, Yahoo Labs and M.P. Wellman, University of Michigan, "Betting Boolean Style : a Framework for Trading in Securities Based on Logical Formulas", Decision Support Systems 39(1):87-104, 2005
E.A. Yuzbashyan, Princeton University, A.A. Baytin, Princeton University and B.L. Altshuler, NEC Laboratories America, "Finite-size Corrections for the Pairing Hamiltonian", Physical Review B 71(9):94505(1-10), 2005
M.K. Ganai, NEC Laboratories America, A. Gupta, NEC Laboratories America and P. Ashar, NEC Laboratories America, "DiVer: SAT-based Model Checking Platform for Verifying Large Scale Systems", Lecture Notes in Computer Science - LNCS 3440 Tools and Algorithms for the Construction and Analysis of Systems. Held as part of the Joint European Conference on Theory and Practice of Software ETAPS Halbwachs, N. (ed.), Springer Verlag, Berlin, pp. 575-580, 2005
H. Jain, NEC Laboratories America, F. Ivancic, NEC Laboratories America, A. Gupta, NEC Laboratories America and M.K. Ganai, NEC Laboratories America, "Localization and Register Sharing for Predicate Abstraction", Lecture Notes in Computer Science - LNCS 3440 Tools and Algorithms for the Construction and Analysis of Systems Held as part of the Joint European Conference on Theory and Practice of Software ETAPS Halbwachs, N. (ed.), Springer Verlag, Berlin, pp. 397-412, 2005
A. Kolarov, NEC Laboratories America, Ting Wang, NEC Laboratories America, B. Sengupta, ExxonMobil and M. Cvijetic, NEC America Inc., "Impact of Waveband Switching on Dimensioning Multi-Granular Hybrid Optical Networks", Proceedings of 9th. Conference on Optical Network Design and modeling, 2005 - ONDM pp. 371-381, 2005
H. Buhrman, Centrum voor Wiskunde en Informatica, L. Fortnow, NECI and A. Pavan, NECI, "Some Results of Derandomization", Theory of Computing Systems 38(2):211-228, 2005
M. Prasad, Fujitsu Laboratories of America, A. Biere, Johannes Kepler University and A. Gupta, NEC Laboratories America, "A Survey of Recent Advances in SAT-based Formal Verification", International Journal on Software Tools for Technology Transfer 7(2): 156-173, 2005
D.S. Saraga, University of Basel, B.L. Altshuler, NEC Laboratories America, D. Loss, University of Basel and R.M. Westervelt, Harvard University, "Coulomb Scattering Cross Section in a Two-Dimensional Electron Gas and Production of Entangled Electrons", Physical Review B 71(4):45338(1-18), 2005
J. Weston, NEC Laboratories America, A. Bordes, NEC Laboratories America and L. Bottou, NEC Laboratories America, "Online (and Offline) on an Even Tighter Budget", Proceedings of the Tenth International Workshop on Artificial Intelligence and Statistics Cowell, Robert (ed.), pp. 413-420, 2005
H. Lekatsas, NEC Laboratories America, J. Henkel, NEC Laboratories America, V. Jakkula, NEC Laboratories America and S.T. Chakradhar, NEC Laboratories America, "A Unified Architecture for Adaptive Compression of Data and Code for Embedded Systems", Proceedings of the 18th. IEEE International Conference on VLSI Design pp. 117-123, 2005
F. Sun, Princeton University, S. Ravi, NEC Laboratories America, A. Raghunathan, NEC Laboratories America and N. K. Jha, Princeton University, "Synthesis of Application-specific Heterogeneous Multiprocessor Architectures using Extensible Processors", Proceedings of the 18th. IEEE International Conference on VLSI Design, 2005 pp. 551-556, 2005
L. Lingappan, Princeton University, S. Ravi, NEC Laboratories America, A. Raghunathan, NEC Laboratories America, N.K. Jha, Princeton University and S.T. Chakradhar, NEC Laboratories America, "Heterogeneous and Multi-level Compression Techniques for Test Volume Reduction in Systems-on-chip", Proceedings of the 18th. IEEE International Conference on VLSI Design pp. 65-70, 2005
N. Bansal, NEC Laboratories America, K. Lahiri, NEC Laboratories America, A. Raghunathan, NEC Laboratories America and S.T. Chakradhar, NEC Laboratories America, "Power Monitors: A Framework for System-Level Power Estimation Using Heterogeneous Power Models", Proceedings of the 18th. IEEE International Conference on VLSI Design 2005 pp. 575-585, 2005
W. Li, University of Iowa, S. Wang, NEC Laboratories America, S. T. Chakradhar, NEC Laboratories America and Sudhakar M. Reddy, University of Iowa, "Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage", Proceedings of the 18th. International Conference on VLSI Design pp. 471-478, 2005
A. Gupta, NEC Laboratories America, M.K. Ganai, NEC Laboratories America and P. Ashar, NEC Laboratories America, "Lazy Constraints and SAT Heuristics for Improving Proof-based Abstraction", Proceedings of the 18th. IEEE International Conference on VLSI Design 2005 pp. 183-188, 2005
M.L. Miller, NEC Laboratories America and J.A. Bloom, Sarnoff Corporation, "Informed Detection Revisited", Lecture Notes in Computer Science 3304 LNCS - Digital Watermarking. Third International Workshop IWDW 2004 Cox, I.J. (ed.), Springer Verlag, Berlin, pp. 29-41, 2005
S. Ganguly, CCRL, S. Bhatnagar, Rutgers University and B. Nath, Rutgers University, "Creating Multipoint-to-Point LSPs for Traffic Engineering", IEEE Communications Magazine 43(1):95-100, 2005
T. Lv, Princeton University, J. Xu, Princeton University, W. Wolf, Princeton University, I.B. Ozer, Princeton University, J. Henkel, NEC Laboratories America and S. Chakradhar, NEC Laboratories America, "A Methodology for Architectural Design of Multimedia Multiprocessor SoCs", IEEE Design and Test of Computers 22(1):18-27, 2005
|
