Zhixing Zhang is a former research intern in the Media Analytics department of NEC Laboratories America, Inc. while studying at Rutgers University.
Recent studies have shown promising performance in open-vocabulary object detection (OVD) by utilizing pseudo labels (PLs) from pretrained vision and language models (VLMs). However, teacher-student self-training, a powerful and widely used paradigm to leverage PLs, is rarely explored for OVD.
Language-based object detection is a promising direction towards building a natural interface to describe objects in images that goes far beyond plain category names. While recent methods show great progress in that direction, proper evaluation is lacking. With OmniLabel, we propose a novel task definition, dataset, and evaluation metric. The task subsumes standard and open-vocabulary detection as well as referring expressions. With more than 30K unique object descriptions on over 25K images, OmniLabel provides a challenge benchmark with diverse and complex object descriptions in a naturally open-vocabulary setting. Moreover, a key differentiation to existing benchmarks is that our object descriptions can refer to one, multiple or even no object, hence, providing negative examples in free-form text. The proposed evaluation handles the large label space and judges performance via a modified average precision metric, which we validate by evaluating strong language-based baselines. OmniLabel indeed provides a challenging test bed for future research on language-based detection.
Recent studies show promising performance in open-vocabulary object detection (OVD) using pseudo labels (PLs) from pretrained vision and language models (VLMs). However, PLs generated by VLMs are extremely noisy due to the gap between the pretraining objective of VLMs and OVD, which blocks further advances on PLs. In this paper, we aim to reduce the noise in PLs and propose a method called online Self-training And a Split-and-fusion head for OVD (SAS-Det). First, the self-training finetunes VLMs to generate high quality PLs while prevents forgetting the knowledge learned in the pretraining. Second, a split-and-fusion (SAF) head is designed to remove the noise in localization of PLs, which is usually ignored in existing methods. It also fuses complementary knowledge learned from both precise ground truth and noisy pseudo labels to boost the performance. Extensive experiments demonstrate SAS-Det is both efficient and effective. Our pseudo labeling is 3 times faster than prior methods. SAS-Det outperforms prior state-of-the-art models of the same scale by a clear margin and achieves 37.4 AP50 and 27.3 APr on novel categories of the COCO and LVIS benchmarks, respectively.
Building robust and generic object detection frameworks requires scaling to larger label spaces and bigger training datasets. However, it is prohibitively costly to acquire annotations for thousands of categories at a large scale. We propose a novel method that leverages the rich semantics available in recent vision and language models to localize and classify objects in unlabeled images, effectively generating pseudo labels for object detection. Starting with a generic and class-agnostic region proposal mechanism, we use vision and language models to categorize each region of an image into any object category that is required for downstream tasks. We demonstrate the value of the generated pseudo labels in two specific tasks, open-vocabulary detection, where a model needs to generalize to unseen object categories, and semi-supervised object detection, where additional unlabeled images can be used to improve the model. Our empirical evaluation shows the effectiveness of the pseudo labels in both tasks, where we outperform competitive baselines and achieve a novel state-of-the-art for open-vocabulary object detection. Our code is available at https://github.com/xiaofeng94/VL-PLM.
Princeton Office
4 Independence Way, Suite 200
Princeton, NJ 08540
+1 609-520-1555
San Jose Office
2033 Gateway Place, Suite 200
San Jose, CA 95110
+1 408-863-6007
NEC Laboratories America, Inc. (NEC Labs) is the US-based center for NEC Corporation’s global network of corporate research laboratories. Our diverse research groups collaborate with industry, academia and governments to provide disruptive solutions to complex problems. A leader in the integration of IT and network technologies with more than 100 years of expertise, NEC provides a combination of products and solutions that cross-utilize the company’s experience and global resources to meet the complex and ever-changing needs of its customers.