Field Verification of Fault Localization with Integrated Physical-Parameter-Aware Methodology

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Publication Date: 11/10/2024

Event: IEEE Photonics Conference (IPC 2024)

Reference: pp. 1-2, 2024

Authors: Hideki Nishizawa, NTT Network Innovation Labs; Giacomo Borraccini, NEC Laboratories America, Inc.; Takeo Sasai, NTT Network Innovation Labs; Yue-Kai Huang, NEC Laboratories America, Inc.; Toru Mano, NTT Network Innovation Labs; Kazuya Anazawa, NTT Network Innovation Labs; Masatoshi Namiki, NTT Network Innovation Center; Soichiroh Usui, NTT Network Innovation Center; Tatsuya Matsumura, NTT Network Innovation Labs; Yoshiaki Sone, NTT Network Innovation Labs; Zehao Wang, Duke University; Seiji Okamoto, NTT Network Innovation Labs; Takeru Inoue, .NTT Network Innovation Labs; Ezra Ip, NEC Laboratories America, Inc.; Andrea D Amico, NEC Laboratories America, Inc.; Tingjun Chen, Duke University; Vittorio Curri, Politecnico di Torino; Ting Wang, NEC Laboratories America, Inc.; Koji Asahi, NEC Corporation; Tomoaki Yoshida, NTT Access Network Service Systems Laboratories; Koichi Takasugi, NTT Network Innovation Labs

Abstract: We report the first field verification of fault localization in an optical line system (OLS) by integrating digital longitudinal monitoring and OLS calibration, highlighting changes in physical metrics and parameters. Use cases shown are degradation of a fiber span loss and optical amplifier noise figure.

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