Polarization Sensing Using Polarization Rotation Matrix Eigenvalue Method

Publication Date: 3/5/2023

Event: OFC 2023

Reference: W1J.7: 1-3, 2023

Authors: Fatih Yaman, NEC Laboratories America, Inc.; Yang Li, NEC Laboratories America, Inc., Georgia State University; Shaobo Han, NEC Laboratories America, Inc.; Takanori Inoue, NEC Corporation; Eduardo Mateo, NEC Corporation; Yoshihisa Inada, NEC Corporation

Abstract: Polarization-based, multi-span sensing over a link with reflection-back circuits is demonstrated experimentally. By measuring rotation matrices instead of just monitoring polarization, a 35 dB extinction in localization is achieved regardless of the disturbance magnitude.

Publication Link: https://ieeexplore.ieee.org/document/10117264