Characterization and Modeling of the Noise Figure Ripple in a Dual-Stage EDFA

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Publication Date: 11/10/2024

Event: IEEE Photonics Conference (IPC 2024)

Reference: pp. 1-2, 2024

Authors: Giacomo Borraccini, NEC Laboratories America, Inc.; Andrea D Amico, NEC Laboratories America, Inc.; Yue-Kai Huang, NEC Laboratories America, Inc.; Vittorio Curri, NEC Laboratories America, Inc.; Ting Wang, NEC Laboratories America, Inc.

Abstract: The noise figure ripple of a dual-stage EDFA is studied starting from experimental measurements under full spectral load conditions and defining device characteristics. A semi-analytical model is then proposed showing 0.1 dB standard deviation on the error distribution in all cases of operation.

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